Alineason also support the customers for their research with the Know-how in the field of material analysis.

The analysis service is based on well established characterization setups and covers three important material properties ― morphology, structure and surface chemistry, realized by atomic force microscopy, X-ray diffraction and photoelectron spectroscopy, respectively.

AFM ― Atomic Force Microscopy

AFM ― Atomic Force MicroscopyAnalysis of surface morphology is carried out with modern high-resolution atomic force microscope. Properties such as roughness, grain size and surface segregation can be characterized with high accuracy.

AFM ― Atomic Force Microscopy

XRD ― X-Ray Diffraction

XRD ― X-Ray Diffraction
Structural properties of your materials are investigated by means of various X-ray diffraction measurements.

Our standard service measurements include

  • Phase determination in polycrystalline materials
  • Structure determination of polycrystalline and monocrystalline materials
  • Determination of texture
  • Reflectivity measurements for determination of film thickness, film density and interface roughness

PES ― Photoelectron Spectroscopy

PES ― Photoelectron SpectroscopyThe investigation of chemical and electronic properties of surfaces and interfaces is carried out with high-resolution monochromatic X-ray photoelectron spectroscopy (XPS) as well as ultraviolet photoelectron spectroscopy (UPS). With these methods a series of important material properties can be determined such as:

  • Chemical bonding
  • Chemical composition
  • Fermi level position
  • Work function and ionization potential