Alineason also support the customers for their research with the Know-how in the field of material analysis.
The analysis service is based on well established characterization setups and covers three important material properties ― morphology, structure and surface chemistry, realized by atomic force microscopy, X-ray diffraction and photoelectron spectroscopy, respectively.
AFM ― Atomic Force Microscopy
Analysis of surface morphology is carried out with modern high-resolution atomic force microscope. Properties such as roughness, grain size and surface segregation can be characterized with high accuracy.
XRD ― X-Ray Diffraction
Structural properties of your materials are investigated by means of various X-ray diffraction measurements.
Our standard service measurements include
- Phase determination in polycrystalline materials
- Structure determination of polycrystalline and monocrystalline materials
- Determination of texture
- Reflectivity measurements for determination of film thickness, film density and interface roughness
PES ― Photoelectron Spectroscopy
The investigation of chemical and electronic properties of surfaces and interfaces is carried out with high-resolution monochromatic X-ray photoelectron spectroscopy (XPS) as well as ultraviolet photoelectron spectroscopy (UPS). With these methods a series of important material properties can be determined such as:
- Chemical bonding
- Chemical composition
- Fermi level position
- Work function and ionization potential